SEM & EDX Analysis

Backscattered electrons are reflected back after interacting with the sample. They help us achieve high-resolution imaging of the elements present and detect differences in atomic number both on and below the surface of the material. 

Secondary electrons originate from the atoms of the sample. They are produced when the electron beam excites the electrons within the sample, causing them to lose some energy in the process. 

Key features: 

• High-resolution imaging 

• Surface morphology examination 

• Microstructural analysis 

• Fractography

The sample surface is bombarded with a high-energy electron beam, which leads to the absorption of energy by the electrons in the sample. As a result, inner shell electrons are ejected. The holes in the inner shells are then filled by electrons from higher energy levels, resulting in the emission of characteristic X-rays. 

These emitted X-rays are measured for their energy and intensity by an energy-dispersive X-ray detector located near the sample. The detected X-rays are then sorted according to their energy, creating a spectrum that represents the elemental composition of the sample, and identifying the elements based on the characteristic X-ray peaks. 

Key features: 

• Elemental analysis 

• Chemical mapping 

• Particle analysis 

• Surface contamination analysis